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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 1, Iss. 7 — Jul. 1, 1984
  • pp: 699–702

Inverting the ratio of the complex parallel and perpendicular reflection coefficients of an absorbing substrate using a transparent thin-film coating

R. M. A. Azzam  »View Author Affiliations


JOSA A, Vol. 1, Issue 7, pp. 699-702 (1984)
http://dx.doi.org/10.1364/JOSAA.1.000699


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Abstract

An absorbing substrate can be coated with a transparent thin film of refractive index N1 (within a certain range) and thickness d such that the ratio of complex reflection coefficients for the p and s polarizations of the film-covered substrate ρ = Rp/Rs is the inverse of that of the film-free substrate ρ ¯ = R ¯ p / R ¯ s at an angle of incidence ϕ. A method to determine the relationship among ϕ, N1, and d that inverts ρ (i.e., makes ρ = 1/ ρ ¯) for a given substrate at a given wavelength is described and is applied to aluminum and silver substrates at 0.6328- and 10.6-μm wavelengths, respectively. Sensitivity of the inversion condition to incidence-angle and film-thickness errors is analyzed. ρ-inverting layers can be applied to one of the two metallic mirrors of a beam displacer or axicon to preserve the polarization state of incident monochromatic radiation.

© 1984 Optical Society of America

History
Original Manuscript: July 28, 1983
Manuscript Accepted: March 7, 1984
Published: July 1, 1984

Citation
R. M. A. Azzam, "Inverting the ratio of the complex parallel and perpendicular reflection coefficients of an absorbing substrate using a transparent thin-film coating," J. Opt. Soc. Am. A 1, 699-702 (1984)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-1-7-699

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