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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 1, Iss. 7 — Jul. 1, 1984
  • pp: 699–702

Inverting the ratio of the complex parallel and perpendicular reflection coefficients of an absorbing substrate using a transparent thin-film coating

R. M. A. Azzam  »View Author Affiliations


JOSA A, Vol. 1, Issue 7, pp. 699-702 (1984)
http://dx.doi.org/10.1364/JOSAA.1.000699


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Abstract

An absorbing substrate can be coated with a transparent thin film of refractive index N1 (within a certain range) and thickness d such that the ratio of complex reflection coefficients for the p and s polarizations of the film-covered substrate ρ = Rp/Rs is the inverse of that of the film-free substrate ρ ¯ = R ¯ p / R ¯ s at an angle of incidence ϕ. A method to determine the relationship among ϕ, N1, and d that inverts ρ (i.e., makes ρ = 1/ ρ ¯) for a given substrate at a given wavelength is described and is applied to aluminum and silver substrates at 0.6328- and 10.6-μm wavelengths, respectively. Sensitivity of the inversion condition to incidence-angle and film-thickness errors is analyzed. ρ-inverting layers can be applied to one of the two metallic mirrors of a beam displacer or axicon to preserve the polarization state of incident monochromatic radiation.

© 1984 Optical Society of America

History
Original Manuscript: July 28, 1983
Manuscript Accepted: March 7, 1984
Published: July 1, 1984

Citation
R. M. A. Azzam, "Inverting the ratio of the complex parallel and perpendicular reflection coefficients of an absorbing substrate using a transparent thin-film coating," J. Opt. Soc. Am. A 1, 699-702 (1984)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-1-7-699


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References

  1. See, for example, R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977) , Sec. 4.4.
  2. This separation-of-variables technique proved useful before. See, e.g., Refs. 3 and 4.
  3. R. M. A. Azzam, A.-R. M. Zaghloul, N. M. Bashara, “Ellipsometric function of a film-substrate system: applications to the design of reflection-type optical devices and to ellipsometry,” J. Opt. Soc. Am. 65, 252–260 (1975). [CrossRef]
  4. R. M. A. Azzam, M. Emdadur, Rahman Khan, “Single-reflection film–substrate half-wave retarders with nearly stationary reflection properties over a wide range of incidence angles,” J. Opt. Soc. Am. 73, 160–166 (1983). [CrossRef]
  5. T. H. Allen, “Study of Al with combined Auger electron spectrometer–ellipsometer system,” J. Vac. Sci. Technol. 13, 112–115 (1976). [CrossRef]
  6. G. Hass, “Mirror coatings,” in Applied Optics and Optical Engineering, R. Kingslake, ed. (Academic, New York, 1965), Vol. 3, Chap. 8.
  7. W. H. Southwell, “Multilayer coatings producing 90° phase change,” Appl. Opt. 18, 1875 (1979). [CrossRef] [PubMed]
  8. R. M. A. Azzam, M. Emdadur, Rahman Khan, “Polarization-preserving single-layer-coated beam displacers and axicons,” Appl. Opt. 21, 3314–3322 (1982). [CrossRef] [PubMed]
  9. D. Fink, “Polarization effects of axicons,” Appl. Opt. 18, 581–582 (1979). [CrossRef] [PubMed]
  10. R. M. A. Azzam, M. Emdadur, Rahman Khan, “Equalization of the TE and TM complex eigenvalues of 90°-rooftop reflectors and waxicons using thin-film dielectric coatings,” Opt. Commun. 44, 223–228 (1983). [CrossRef]
  11. See, for example, Z. Knittl, Optics of Thin Films (Wiley, New York, 1976), Sec. 9.7.
  12. See, for example, E. C. Jordan, K. G. Balmain, Electromagnetic Waves and Radiating Systems (Prentice-Hall, Englewood Cliffs, N.J., 1968), p. 230.
  13. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977), Sec. 1.7.
  14. V. H. Rumsey, G. A. Deschamps, M. L. Kales, J. I. Bohnert, “Techniques for handling elliptically polarized waves with special reference to antennas,” Proc. IRE 39, 533–551 (1951). [CrossRef]
  15. If θ and ɛ represent the azimuth and ellipticity angle, respectively, of the polarization ellipse of the reflected light from the bare substrate, (π/2) − θ and −ɛ will be the corresponding parameters of the light reflected from the substrate coated with the ρ-inverting layer. (See Ref. 1, p. 40 .)

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