The 4X4 matrix formalisms developed respectively by Berreman [D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972)] and by Yeh [P. Yeh, J. Opt. Soc. Am. 69, 742 (1979)] for the description of the ellipsometric properties of planar multilayer anisotropic media are compared. Features of both are used to provide a framework that is applicable to the calculation of ellipsometric properties of, e.g., stratified media that incorporate magnetic materials.
© 1984 Optical Society of America
P. J. Lin-Chung and S. Teitler, "4X4 Matrix formalisms for optics in stratified anisotropic media," J. Opt. Soc. Am. A 1, 703-705 (1984)