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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 1, Iss. 7 — Jul. 1, 1984
  • pp: 742–753

Thin-films field-transfer matrix theory of planar multilayer waveguides and reflection from prism-loaded waveguides

John Chilwell and Ian Hodgkinson  »View Author Affiliations


JOSA A, Vol. 1, Issue 7, pp. 742-753 (1984)
http://dx.doi.org/10.1364/JOSAA.1.000742


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Abstract

A standard 2 × 2 matrix method-used in thin-film optics is applied to planar multilayer optical waveguides. All modes are required to satisfy substrate-to-cover field-transfer equations that reduce to the equation γcm11 + γcγsm12 + m21 + γsm22 = 0 for bound modes and leaky waves. Expressions are derived for the field profiles and the power in each medium. A first-order perturbation theory is developed and applied to absorbing multilayer guides and to the reflection of plane waves from the prism-loaded lossy multilayer guide. The latter leads to experimental arrangements for measuring losses in which the gap thickness and propagation constant are accessible parameters.

© 1984 Optical Society of America

History
Original Manuscript: October 27, 1983
Manuscript Accepted: February 17, 1984
Published: July 1, 1984

Citation
John Chilwell and Ian Hodgkinson, "Thin-films field-transfer matrix theory of planar multilayer waveguides and reflection from prism-loaded waveguides," J. Opt. Soc. Am. A 1, 742-753 (1984)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-1-7-742

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