A new kind of lateral shearing interferometer, called the three-wave lateral shearing interferometer, was previously described [ Appl. Opt. 32, 6242 ( 1993)]. As this instrument was monochromatic and its usable light efficiency was poor, the proposed setup was well suited only for a class of wave-front sensing problems, such as optical testing, in which the source can be easily adapted. A new achromatic setup adapted to low light level applications is presented. Three replicas of the analyzed wave front are obtained by Fourier filtering of the orders diffracted by a microlens array. An important feature of these new devices is their great similarity to another class of wave-front sensors based on the Hartmann test.
© 1995 Optical Society of America
Original Manuscript: October 17, 1994
Revised Manuscript: June 20, 1995
Manuscript Accepted: July 6, 1995
Published: December 1, 1995
J. Primot and L. Sogno, "Achromatic three-wave (or more) lateral shearing interferometer," J. Opt. Soc. Am. A 12, 2679-2685 (1995)