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Eigenvalue analysis of the surface forces apparatus interferometer

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Abstract

The resonant wavelengths, transmission, and eigenpolarizations have been obtained for a symmetric three-layer multiple-beam interferometer comprising arbitrarily oriented mica sheets with high-reflectance coatings on the outer surfaces confining an optically anisotropic medium. The interferometer configuration is one that is commonly used in the surface forces apparatus. Numerical results for typical surface forces apparatus configurations are presented. The analysis is applicable to lossy media as well as to asymmetric configurations and to media with additional layers.

© 1995 Optical Society of America

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