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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 12, Iss. 9 — Sep. 1, 1995
  • pp: 2072–2076

Pulsed laser fluorophore deposition: a method for measuring the axial resolution in two-photon fluorescence microscopy

Stefan W. Hell, Axel R. Utz, Martin Schrader, Pekka E. Hänninen, and Erkki Soini  »View Author Affiliations


JOSA A, Vol. 12, Issue 9, pp. 2072-2076 (1995)
http://dx.doi.org/10.1364/JOSAA.12.002072


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Abstract

We report the generation of thin (< 50 nm) fluorescence layers on a glass substrate in the focal region of a high-numerical-aperture lens by employing subpicosecond pulses of 0.75-TW/cm2 peak intensity. The conditions for generating the fluorescence layers are described. We find that the fluorescence molecules at the glass interface are less affected by bleaching than those in the surrounding area. The fluorescence layers are suited for measuring and monitoring the axial resolution of two-photon fluorescence microscopes.

© 1995 Optical Society of America

History
Original Manuscript: September 6, 1994
Revised Manuscript: April 18, 1995
Manuscript Accepted: April 25, 1995
Published: September 1, 1995

Citation
Stefan W. Hell, Axel R. Utz, Martin Schrader, Pekka E. Hänninen, and Erkki Soini, "Pulsed laser fluorophore deposition: a method for measuring the axial resolution in two-photon fluorescence microscopy," J. Opt. Soc. Am. A 12, 2072-2076 (1995)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-12-9-2072


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References

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