OSA's Digital Library

Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 15, Iss. 10 — Oct. 1, 1998
  • pp: 2769–2782

Specific approach of generalized ellipsometry for the determination of weak in-plane anisotropy: application to Langmuir–Blodgett ultrathin films

B. Lecourt, D. Blaudez, and J.-M. Turlet  »View Author Affiliations


JOSA A, Vol. 15, Issue 10, pp. 2769-2782 (1998)
http://dx.doi.org/10.1364/JOSAA.15.002769


View Full Text Article

Acrobat PDF (848 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We report on a procedure of generalized ellipsometry for the determination of the optical constants of stratified samples that present a weak in-plane anisotropy. We first derive the analytical expressions of the Jones reflection matrix and of the detected intensity for a rotating-polarizer ellipsometer configuration. These expressions show that the in-plane birefringence and the orientation of the principal axes of the dielectric tensor can be obtained from a measurement of the normalized off-diagonal terms of the reflection matrix as a function of the sample azimuth, followed by a Fourier analysis and a wavelength-by-wavelength inversion of these experimental data. We apply this method to the optical characterization of Langmuir–Blodgett molecular films deposited on silicon substrates. The obtained results show that even for transparent and ultrathin films it is possible to accurately determine very weak in-plane birefringence and axis orientations.

© 1998 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(260.1180) Physical optics : Crystal optics
(260.1440) Physical optics : Birefringence
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: January 5, 1998
Revised Manuscript: May 13, 1998
Manuscript Accepted: June 1, 1998
Published: October 1, 1998

Citation
B. Lecourt, D. Blaudez, and J.-M. Turlet, "Specific approach of generalized ellipsometry for the determination of weak in-plane anisotropy: application to Langmuir–Blodgett ultrathin films," J. Opt. Soc. Am. A 15, 2769-2782 (1998)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-15-10-2769


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
  2. R. C. Jones, “A new calculus for the treatment of optical systems. I. Description and discussion of the calculus,” J. Opt. Soc. Am. 31, 488–493 (1941). [CrossRef]
  3. D. den Engelsen, “Ellipsometry of anisotropic films,” J. Opt. Soc. Am. 61, 1460–1466 (1971). [CrossRef]
  4. R. M. A. Azzam, N. M. Bashara, “Generalized ellipsometry for surfaces with directional preference: application to diffraction gratings,” J. Opt. Soc. Am. 62, 1521–1523 (1972). [CrossRef]
  5. D. J. De Smet, “Ellipsometry of anisotropic thin films,” J. Opt. Soc. Am. 64, 631–638 (1974). [CrossRef]
  6. A. Y. Tronin, A. F. Konstantinova, “Ellipsometric study of the optical anisotropy of lead arachidate Langmuir films,” Thin Solid Films 177, 305–314 (1989). [CrossRef]
  7. M. Schubert, B. Rheinländer, J. A. Woollam, B. Johs, C. M. Herzinger, “Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO2,” J. Opt. Soc. Am. A 13, 875–883 (1996). [CrossRef]
  8. M. Schubert, B. Rheinländer, C. Cramer, H. Schmiedel, J. A. Woollam, C. M. Herzinger, B. Johs, “Generalized transmission ellipsometry for twisted biaxial dielectric media: application to chiral liquid crystals,” J. Opt. Soc. Am. A 13, 1930–1940 (1996). [CrossRef]
  9. D. W. Thompson, M. J. DeVries, T. E. Tiwald, J. A. Woollam, “Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry,” Thin Solid Films, 313–314, 341–346 (1998). [CrossRef]
  10. M. Schubert, “Generalized ellipsometry and complex optical systems,” Thin Solid Films, 313–314, 323–332 (1998). [CrossRef]
  11. H. Kuhn, D. Möbius, H. Bücher, Physical Methods of Chemistry (Wiley, New York, 1972), Vol. 1, Chap. 7.
  12. G. G. Roberts, Langmuir–Blodgett Films (Plenum, New York, 1990).
  13. A. Ulman, Ultrathin Organic Films (Academic, San Diego, Calif., 1991).
  14. Y. Ishino, H. Ishida, “Spectral simulation of uniaxially oriented monolayers in the infrared,” Langmuir 4, 1341–1346 (1988). [CrossRef]
  15. P. A. Chollet, “Determination by infrared absorption of the orientation of molecules in monomolecular layers,” Thin Solid Films 52, 343–360 (1978). [CrossRef]
  16. D. Blaudez, T. Buffeteau, B. Desbat, N. Escafre, J.-M. Turlet, “Inplane organization of Langmuir–Blodgett monolayers from FTIR,” Thin Solid Films 210/211, 648–651 (1992). [CrossRef]
  17. D. W. Berreman, “Optics in stratified and anisotropic media: 4×4-matrix formulation,” J. Opt. Soc. Am. 62, 502–510 (1972). [CrossRef]
  18. H. Wöhler, M. Fritsch, G. Haas, D. A. Mlynski, “Characteristic matrix method for stratified anisotropic media: optical properties of special configurations,” J. Opt. Soc. Am. A 8, 536–540 (1991). [CrossRef]
  19. M. Schubert, “Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems,” Phys. Rev. B 53, 4265–4274 (1996). [CrossRef]
  20. H. Coudrile, M. Steers, J. B. Theeten, “Dispositif électronique pour l’analyse et le calcul des coefficients de Fourier d’une fonction périodique, et ellipsomètre comportant un tel dispositif,” French patent8020838 (September29, 1980).
  21. E. Palik, Handbook of Optical Constants of Solids (Academic, San Diego, Calif., 1985), pp. 547–552 and 749–752.
  22. D. Blaudez, T. Buffeteau, N. Castaings, B. Desbat, J.-M. Turlet, “Organization in pure and alternate deuterated cadmium arachidate monolayers on solid substrates and at the air/water interface by conventional and differential Fourier transform infrared spectroscopies,” J. Chem. Phys. 104, 9983–9993 (1996). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited