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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 15, Iss. 7 — Jul. 1, 1998
  • pp: 1940–1951

X-ray imaging with submicrometer resolution employing transparent luminescent screens

Andreas Koch, Carsten Raven, Per Spanne, and Anatoly Snigirev  »View Author Affiliations

JOSA A, Vol. 15, Issue 7, pp. 1940-1951 (1998)

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Microimaging techniques with synchrotron radiation demand fast, on-line x-ray detectors with a spatial resolution in the micrometer or submicrometer range. For this task an x-ray detector based on a transparent, i.e., nonscattering, luminescent screen has been developed. Its performance is described experimentally and theoretically. The detector consists of an Y3Al5O12:Ce screen, microscope optics, and a low-noise CCD camera, operated at x-ray energies between 10 and 50 keV. Good image quality is achieved if the depth of focus of the optical system is matched to the x-ray absorption length or thickness of the scintillator. A spatial resolution of 0.8 µm fwhm (1000 line pairs/mm with 10% contrast) was measured by recording the interferogram of a boron fiber. First applications in phase contrast imaging and microtomography are shown.

© 1998 Optical Society of America

OCIS Codes
(110.6960) Imaging systems : Tomography
(110.7440) Imaging systems : X-ray imaging
(180.7460) Microscopy : X-ray microscopy
(220.4830) Optical design and fabrication : Systems design
(260.3800) Physical optics : Luminescence
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: August 18, 1997
Revised Manuscript: January 28, 1998
Manuscript Accepted: March 9, 1998
Published: July 1, 1998

Andreas Koch, Carsten Raven, Per Spanne, and Anatoly Snigirev, "X-ray imaging with submicrometer resolution employing transparent luminescent screens," J. Opt. Soc. Am. A 15, 1940-1951 (1998)

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