A singular-value-decomposition analysis of the imaging kernel for three-dimensional fluorescent laser scanning microscopy at a high numerical aperture (NA) is presented. The design and superresolving performance of image-plane binary optical masks are then derived, and new computational techniques for calculating these masks are given. Initial experimental results with a microscope equipped with such a mask at NA= 1.3 are presented. The improvement in both contrast and resolution over the confocal and type 1 instruments is demonstrated.
© 1998 Optical Society of America
(070.4560) Fourier optics and signal processing : Data processing by optical means
(180.1790) Microscopy : Confocal microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.5810) Microscopy : Scanning microscopy
(180.6900) Microscopy : Three-dimensional microscopy
Ibrahim Akduman, Ulrich Brand, Jan Grochmalicki, Gerard Hester, Roy Pike, and Mario Bertero, "Superresolving masks for incoherent high-numerical-aperture scanning microscopy in three dimensions," J. Opt. Soc. Am. A 15, 2275-2287 (1998)