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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 16, Iss. 1 — Jan. 1, 1999
  • pp: 141–148

Observation and analysis of near-field optical diffraction

Th. Huser, L. Novotny, Th. Lacoste, R. Eckert, and H. Heinzelmann  »View Author Affiliations


JOSA A, Vol. 16, Issue 1, pp. 141-148 (1999)
http://dx.doi.org/10.1364/JOSAA.16.000141


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Abstract

We present an experimental study of near-field optical interactions between an optical probe and sample objects with different dielectric properties. The interaction strongly affects the radiation emitted at angles beyond the critical angle of total internal reflection in the substrate (the forbidden light regime). Such an effect has been predicted theoretically. Our experimental data show that if a conducting object is close to the optical probe, p-polarized optical fields are deflected away from the object. On the other hand, s-polarized fields are deflected toward dielectric objects. The experimental results show good qualitative agreement with numerical simulations. The described effects have a strong influence on image formation in scanning near-field optical microscopy and thus have to be taken into account for image analysis.

© 1999 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.5810) Microscopy : Scanning microscopy
(240.7040) Optics at surfaces : Tunneling
(260.5430) Physical optics : Polarization

Citation
Th. Huser, L. Novotny, Th. Lacoste, R. Eckert, and H. Heinzelmann, "Observation and analysis of near-field optical diffraction," J. Opt. Soc. Am. A 16, 141-148 (1999)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-16-1-141


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References

  1. For a review of research in the field, see Proceedings of the IVth International Conference on Near-Field Optics and Related Techniques, P. Kruit and S. M. Lindsay, eds., Ultramicroscopy 71, 1–398 (1998).
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  17. Th. Huser, “Polarization contrast in allowed and forbidden light scanning near-field optical microscopy,” Ph.D. dissertation (University of Basel, Basel, Switzerland, 1998).

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