Characterization of index profiles of Zn-diffused LiNbO3 waveguides
JOSA A, Vol. 16, Issue 10, pp. 2574-2580 (1999)
http://dx.doi.org/10.1364/JOSAA.16.002574
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Abstract
We characterize the refractive-index profiles of Z-cut and X-cut Zn-diffused LiNbO3 substrates from the vapor phase. We obtained these profiles by reflectivity measurements of the samples, using the prism coupling technique at each step of a systematic polishing, and then fitting the data with a program that models a multilayer optical structure. For diffusions performed at 800 °C, four different layers were clearly distinguished in the LiNbO3:Zn diffused samples, the first one being a very thin layer of polycrystalline ZnO. Two step-index layers were also detected: One was isotropic, and the other showed birefringence depending on the crystal cut. These two layers were correlated with Zn-rich phases previously detected in Zn-diffused LiNbO3 by x-ray techniques. The fourth layer detected presents a graded-index profile and corresponds to the formation of a Zn-containing solid solution with a LiNbO3-likestructure. These results are discussed and compared with the phases reported for Ti-diffused LiNbO3.
© 1999 Optical Society of America
[Optical Society of America ]
OCIS Codes
(130.3130) Integrated optics : Integrated optics materials
(130.3730) Integrated optics : Lithium niobate
(160.6990) Materials : Transition-metal-doped materials
(230.7390) Optical devices : Waveguides, planar
Citation
Rubén Nevado and Ginés Lifante, "Characterization of index profiles of Zn-diffused LiNbO3 waveguides," J. Opt. Soc. Am. A 16, 2574-2580 (1999)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-16-10-2574
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