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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 16, Iss. 11 — Nov. 1, 1999
  • pp: 2649–2657

Polarization-resolved imaging with a reflection near-field optical microscope

Sergey I. Bozhevolnyi, Mufei Xiao, and Jørn M. Hvam  »View Author Affiliations

JOSA A, Vol. 16, Issue 11, pp. 2649-2657 (1999)

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Using a rigorous microscopic point-dipole description of probe–sample interactions, we study imaging with a reflection scanning near-field optical microscope. Optical content, topographical artifacts, sensitivity window—i.e., the scale on which near-field optical images represent mainly optical contrast—and symmetry properties are considered for optical images obtained in constant-distance mode for different polarization configurations. We demonstrate that images obtained in cross-polarized detection mode are free of background and topographical artifacts and that the cross-circular polarization configuration is preferable to the cross-linear one, since it ensures more isotropic (in the surface plane) near-field imaging of surface features. The numerical results are supported with experimental near-field images obtained by using a reflection microscope with an uncoated fiber tip.

© 1999 Optical Society of America

OCIS Codes
(110.2990) Imaging systems : Image formation theory
(180.5810) Microscopy : Scanning microscopy
(290.4210) Scattering : Multiple scattering

Original Manuscript: March 2, 1999
Revised Manuscript: July 19, 1999
Manuscript Accepted: July 19, 1999
Published: November 1, 1999

Sergey I. Bozhevolnyi, Mufei Xiao, and Jørn M. Hvam, "Polarization-resolved imaging with a reflection near-field optical microscope," J. Opt. Soc. Am. A 16, 2649-2657 (1999)

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