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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 16, Iss. 11 — Nov. 1, 1999
  • pp: 2720–2736

Third-order small-perturbation method for scattering from dielectric rough surfaces

Joel T. Johnson  »View Author Affiliations


JOSA A, Vol. 16, Issue 11, pp. 2720-2736 (1999)
http://dx.doi.org/10.1364/JOSAA.16.002720


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Abstract

The small-perturbation method (SPM) for rough surface scattering, originally derived by Rice [Commun. Pure Appl. Math. 4, 361 (1951)], has been applied extensively to problems in optics, remote sensing, and propagation. Typical uses of the theory involve only the first- or second-order scattered fields in surface height, owing to increasing complexity of the SPM equations as order increases. The SPM equations are solved in a systematic manner that permits third order in surface-height terms to be determined apparently for the first time for scattering from a dielectric surface rough in two directions. Sample results for both periodic and nonperiodic surfaces show that third-order field terms can contribute to fourth-order scattered power and also to a third-order specular-reflection coefficient correction for surfaces with nonvanishing bispectra. The latter case is of particular interest in passive remote sensing of the ocean, since these third-order terms contribute to the first prediction of a first azimuthal harmonic of ocean brightness temperatures.

© 1999 Optical Society of America

OCIS Codes
(290.5880) Scattering : Scattering, rough surfaces

History
Original Manuscript: February 22, 1999
Revised Manuscript: June 25, 1999
Manuscript Accepted: June 25, 1999
Published: November 1, 1999

Citation
Joel T. Johnson, "Third-order small-perturbation method for scattering from dielectric rough surfaces," J. Opt. Soc. Am. A 16, 2720-2736 (1999)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-16-11-2720

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