OSA's Digital Library

Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 16, Iss. 2 — Feb. 1, 1999
  • pp: 331–338

Light scattering from slightly rough dielectric films

Yu. S. Kaganovskii, V. D. Freilikher, E. Kanzieper, Y. Nafcha, M. Rosenbluh, and I. M. Fuks  »View Author Affiliations

JOSA A, Vol. 16, Issue 2, pp. 331-338 (1999)

View Full Text Article

Enhanced HTML    Acrobat PDF (465 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



It is shown that the long-scale (smooth) component of the roughness spectrum of a slightly rough dielectric layer critically affects the angular distribution of radiation scattered from the surface. The interference pattern obtained from a sample with only small-scale roughness differs drastically from a sample with the same small-scale roughness but possessing slight (of the order λ/10) variation of the thickness of the dielectric layer. It is shown that when interference phenomena are significant and the dielectric film has long-scale roughness, conventional perturbation theory is invalid, even if the rms of roughness is much smaller than the wavelength. A model is presented that correctly predicts the measured angular intensity distributions in the scattered-light field for samples that possess arbitrary scales of roughness.

© 1999 Optical Society of America

OCIS Codes
(240.0240) Optics at surfaces : Optics at surfaces
(240.0310) Optics at surfaces : Thin films
(240.5770) Optics at surfaces : Roughness
(260.3160) Physical optics : Interference
(290.0290) Scattering : Scattering
(290.5880) Scattering : Scattering, rough surfaces

Original Manuscript: May 1, 1998
Revised Manuscript: September 8, 1998
Manuscript Accepted: September 21, 1998
Published: February 1, 1999

Yu. S. Kaganovskii, V. D. Freilikher, E. Kanzieper, Y. Nafcha, M. Rosenbluh, and I. M. Fuks, "Light scattering from slightly rough dielectric films," J. Opt. Soc. Am. A 16, 331-338 (1999)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. T. Young, “Lecture on the theory of light and colours,” Philos. Trans. R. Soc. London, Part 1, 41–48 (1802).
  2. G. Stokes, “On the colours of thick plates,” Trans. Cambridge Philos. Soc. 9, 147–176 (1851).
  3. C. V. Raman, G. L. Datta, “On Quetelet’s rings and other allied phenomena,” Philos. Mag. Ser. 6 42, 826–840 (1921). [CrossRef]
  4. A. J. de Witte, “Interference in scattered light,” Am. J. Phys. 35, 301–313 (1967). [CrossRef]
  5. M. Françon, Laser Speckle and Applications in Optics (Academic, New York, 1979).
  6. M. Françon, “Information processing using speckle pat-terns,” in Laser Speckle and Related Phenomena, J. C. Dainty, ed. (Springer-Verlag, New York, 1984).
  7. J. Q. Lu, J. A. Sánchez-Gil, E. R. Méndez, Z.-H. Gu, A. A. Maradudin, “Scattering of light from a rough dielectric film on a reflecting substrate: diffuse fringes,” J. Opt. Soc. Am. A 15, 185–195 (1998). [CrossRef]
  8. A. I. Kalmykov, I. Fuks, I. Sherbinin, V. Tsymbal, A. Matveev, V. Freilikher, M. Fix, “Radar observation of strong subsurface scatterers,” in Proceedings of the International Geoscience and Remote Sensing Symposium ’95 (Institute of Electrical and Electronics Engineers, Piscataway, N.J., 1995), Vol. 3, p. 1702.
  9. J. F. McGilp, “Optical characterization of semiconductor surfaces and interfaces,” Prog. Surf. Sci. 49, 1–106 (1995). [CrossRef]
  10. C. van de Hulst, Light Scattering by Small Particles (Wiley, New York, 1957).
  11. C. F. Bohren, D. R. Huffman, Absorption and Scattering of Light by Small Particles (Wiley, New York, 1983).
  12. V. Freilikher, M. Pustilnik, I. Yurkevich, V. Tatarskii, “Polarization of light scattered from slightly rough dielectric film,” Opt. Lett. 19, 1382–1384 (1994). [CrossRef] [PubMed]
  13. F. G. Bass, I. M. Fuks, Wave Scattering from a Statistically Rough Surface (Pergamon, New York, 1979).
  14. Yu. Kaganovskii, V. D. Freilikher, V. V. Grischenko, I. M. Popova, “Estimate of micro roughness parameters on a solid surface by light scattering method,” Pribory i Tekh. Exp., No. 4, 258–260 (1976) (in Russian).
  15. Yu. S. Kaganovskii, V. D. Freilikher, E. Kanzieper, Y. Nafcha, M. Rosenbluh, “Interference in light scattering from slightly rough dielectric layers,” Opt. Lett. 23, 316–318 (1998). [CrossRef]
  16. V. Freilikher, M. Pustilnik, I. Yurkevich, “Wave scattering from a bounded medium with disorder,” Phys. Lett. A 193, 467–470 (1994). [CrossRef]
  17. J. Sánchez-Gil, A. Maradudin, J. Lu, V. Freilikher, M. Pustilnik, I. Yurkevich, “Satellite peaks in the scattering of p-polarized light from a randomly rough film on a perfectly conducting substrate,” J. Mod. Opt. 43, 435–452 (1996). [CrossRef]
  18. M. Nieto Vesperinas, J. C. Dainty, eds., Scattering in Volumes and Surfaces (North-Holland, Amsterdam, 1990).
  19. V. Freilikher, E. Kanzieper, A. Maradudin, “Coherent scattering enhancement in systems bounded by rough surfaces,” Phys. Rep. 288, 127–204 (1997). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited