Speckle-induced phase error in laser-based phase-shifting projected fringe profilometry
JOSA A, Vol. 16, Issue 6, pp. 1484-1495 (1999)
http://dx.doi.org/10.1364/JOSAA.16.001484
Acrobat PDF (352 KB)
Abstract
Laser sources offer advantages over white-light sources in some phase-shifting projected fringe profilometry applications. These benefits, however, are gained at the cost of incurring speckle noise. Some basic statistics of speckle-induced phase-measurement errors are investigated based on the multiplicative noise model for image-plane speckles. First, the dependence of phase-error distribution and measurement uncertainty on speckle size and grating pitch is numerically studied, based on the Karhunen–Loève expansion method. Then an analytical expression that relates phase-error distributions to optical system parameters is derived as a direct extension of the simulation results. This expression is useful for system design and optimization. Analysis shows that phase noise caused by speckles can be modeled as additive white Gaussian noise. Optical system design and noise-reduction algorithms are also briefly discussed, based on the simulation results.
© 1999 Optical Society of America
[Optical Society of America ]
OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
Citation
Hongyu Liu, Guowen Lu, Shudong Wu, Shizhuo Yin, and Francis T. S. Yu, "Speckle-induced phase error in laser-based phase-shifting projected fringe profilometry," J. Opt. Soc. Am. A 16, 1484-1495 (1999)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-16-6-1484
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Phase-Shifter Calibration and Error Detection in Phase-Shifting Applications: A New Method (AO)
- Spatiotemporal Phase Unwrapping for the Measurement of Discontinuous Objects in Dynamic Fringe-Projection Phase-Shifting Profilometry (AO)
- Profile Measurement taken with Liquid-Crystal Gratings (AO)
- Systematic Errors of Phase-Shifting Speckle Interferometry (AO)
- High-Precision Shape Measurement by White-Light Interferometry with Real-Time Scanner Error Correction (AO)
Related Conference Papers
- Nonlinear effects on the carrier-envelope phase
- Self-calibrating white-light interferometry techniques for shape measurement
- Vibration insensitive interferometric optical testing
- Improved optical metrology using phase retrieval
- Analysis of Eyewear Glasses and Ophthalmic Lenses Using Fourier Interferometry
« Previous Article | Next Article »
OSA is a member of 