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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 16, Iss. 7 — Jul. 1, 1999
  • pp: 1700–1702

Differential reflection phase shift under conditions of attenuated internal reflection

R. M. A. Azzam  »View Author Affiliations

JOSA A, Vol. 16, Issue 7, pp. 1700-1702 (1999)

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The angle-of-incidence dependence of the differential reflection phase shift Δ between p and s polarizations is considered a function of the real and imaginary parts of the relative complex dielectric function ε of an interface in the domain of fractional optical constants, i.e., under conditions of internal reflection. The constraint on complex ε such that oscillatory and monotonic angular responses are obtained is determined. A sensitive and stable technique, which is based on attenuated internal reflection ellipsometry between the Brewster angle and the critical angle, is proposed for measuring small induced absorption (εi10-5) in the medium of refraction.

© 1999 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(240.0240) Optics at surfaces : Optics at surfaces

Original Manuscript: October 9, 1998
Manuscript Accepted: January 12, 1999
Published: July 1, 1999

R. M. A. Azzam, "Differential reflection phase shift under conditions of attenuated internal reflection," J. Opt. Soc. Am. A 16, 1700-1702 (1999)

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  1. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1987).
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