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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 17, Iss. 1 — Jan. 1, 2000
  • pp: 135–141

Ellipsomicroscopy for surface imaging: contrast mechanism, enhancement, and application to CO oxidation on Pt(110)

Jan Dicke, Harm-Hinrich Rotermund, and Jochen Lauterbach  »View Author Affiliations


JOSA A, Vol. 17, Issue 1, pp. 135-141 (2000)
http://dx.doi.org/10.1364/JOSAA.17.000135


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Abstract

Ellipsomicroscopy for surface imaging (EMSI) is a powerful new tool for studying spatiotemporal adsorbate pattern formation on catalyst surfaces. It is a surface-sensitive technique that is able to measure submonolayer coverage of adsorbates. The imaging of the sample’s surface achieves a spatial sensitivity, making it possible to measure nonuniformity of adsorbate coverage. The image contrast, however, depends strongly on the setup of the instrument. The optimum setup can be calculated from the ellipsometric properties of the catalyst/adsorbate system and the intrinsic parameters of the EMSI instrument. Optimizing the setup of the EMSI instrument permitted enhancement of the image contrast over the previous setup. As a result, new features in CO oxidation on Pt(110) were discovered.

© 2000 Optical Society of America

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(240.6700) Optics at surfaces : Surfaces
(260.2130) Physical optics : Ellipsometry and polarimetry
(300.6490) Spectroscopy : Spectroscopy, surface
(330.1800) Vision, color, and visual optics : Vision - contrast sensitivity

History
Original Manuscript: April 20, 1999
Revised Manuscript: September 8, 1999
Manuscript Accepted: September 16, 1999
Published: January 1, 2000

Citation
Jan Dicke, Harm-Hinrich Rotermund, and Jochen Lauterbach, "Ellipsomicroscopy for surface imaging: contrast mechanism, enhancement, and application to CO oxidation on Pt(110)," J. Opt. Soc. Am. A 17, 135-141 (2000)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-17-1-135


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