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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 17, Iss. 12 — Dec. 1, 2000
  • pp: 2243–2248

Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopy

Xavier Borrisé, David Jiménez, Francesc Pérez-Murano, Andreu Llobera, Carlos Domı́nguez, and Núria Barniol  »View Author Affiliations


JOSA A, Vol. 17, Issue 12, pp. 2243-2248 (2000)
http://dx.doi.org/10.1364/JOSAA.17.002243


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Abstract

Silicon-based antiresonant reflecting optical waveguide (ARROW) devices were studied by means of a scanning near-field optical microscope. Various structures such as a Y junction of a Mach–Zehnder interferometer and a directional optical coupler were characterized, showing the propagation of the light inside the devices simultaneously with the topography. Scattering on the splitting point of the Y junction was shown, as well as a partial coupling of the light between the two branches of the coupler. Measurements on the decay length of the evanescent field were also performed to study the use of the ARROW waveguide for sensor purposes.

© 2000 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(130.0250) Integrated optics : Optoelectronics
(130.3120) Integrated optics : Integrated optics devices
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(230.7370) Optical devices : Waveguides

History
Original Manuscript: March 30, 2000
Revised Manuscript: July 25, 2000
Manuscript Accepted: June 16, 2000
Published: December 1, 2000

Citation
Xavier Borrisé, David Jiménez, Francesc Pérez-Murano, Andreu Llobera, Carlos Domı́nguez, and Núria Barniol, "Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopy," J. Opt. Soc. Am. A 17, 2243-2248 (2000)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-17-12-2243

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