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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 17, Iss. 4 — Apr. 1, 2000
  • pp: 729–739

Electromagnetic analysis of axially symmetric diffractive lenses with the method of moments

Dennis W. Prather and Shouyuan Shi  »View Author Affiliations


JOSA A, Vol. 17, Issue 4, pp. 729-739 (2000)
http://dx.doi.org/10.1364/JOSAA.17.000729


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Abstract

We present the electromagnetic analysis of axially symmetric diffractive lenses. Analysis is performed by numerically solving the electric and magnetic field integral equations using the method of moments, and it exploits axial symmetry to reduce computational cost. Formulations for the analysis of lossless dielectric and perfectly conducting lenses are presented. The analysis of binary and eight-level lenses are performed to illustrate the utility of the technique.

© 2000 Optical Society of America

OCIS Codes
(050.1970) Diffraction and gratings : Diffractive optics

History
Original Manuscript: June 28, 1999
Revised Manuscript: November 1, 1999
Manuscript Accepted: December 17, 1999
Published: April 1, 2000

Citation
Dennis W. Prather and Shouyuan Shi, "Electromagnetic analysis of axially symmetric diffractive lenses with the method of moments," J. Opt. Soc. Am. A 17, 729-739 (2000)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-17-4-729

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