Interferometry with laser diodes is a cost-effective way to perform displacement measurement. The tunability of laser diodes is also of great interest in multiple-wavelength interferometry. However, the additional flicker noise in the frequency-noise spectrum of semiconductor lasers may become a limiting factor. Investigations on the limitations due to the 1/f noise of laser diodes are presented for both classical and multiple-wavelength interferometry. Measurements at the limit of the coherence length of laser diodes with the corresponding phase fluctuations are reported. The theoretical results are verified experimentally.
© 2000 Optical Society of America
(030.1640) Coherence and statistical optics : Coherence
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(140.2020) Lasers and laser optics : Diode lasers
Yves Salvadé and René Dändliker, "Limitations of interferometry due to the flicker noise of laser diodes," J. Opt. Soc. Am. A 17, 927-932 (2000)