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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 17, Iss. 5 — May. 1, 2000
  • pp: 927–932

Limitations of interferometry due to the flicker noise of laser diodes

Yves Salvadé and René Dändliker  »View Author Affiliations


JOSA A, Vol. 17, Issue 5, pp. 927-932 (2000)
http://dx.doi.org/10.1364/JOSAA.17.000927


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Abstract

Interferometry with laser diodes is a cost-effective way to perform displacement measurement. The tunability of laser diodes is also of great interest in multiple-wavelength interferometry. However, the additional flicker noise in the frequency-noise spectrum of semiconductor lasers may become a limiting factor. Investigations on the limitations due to the 1/f noise of laser diodes are presented for both classical and multiple-wavelength interferometry. Measurements at the limit of the coherence length of laser diodes with the corresponding phase fluctuations are reported. The theoretical results are verified experimentally.

© 2000 Optical Society of America

OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(140.2020) Lasers and laser optics : Diode lasers

History
Original Manuscript: April 19, 1999
Revised Manuscript: November 1, 1999
Manuscript Accepted: November 29, 1999
Published: May 1, 2000

Citation
Yves Salvadé and René Dändliker, "Limitations of interferometry due to the flicker noise of laser diodes," J. Opt. Soc. Am. A 17, 927-932 (2000)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-17-5-927

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