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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 17, Iss. 8 — Aug. 1, 2000
  • pp: 1454–1460

Optical properties of a thin-film stack illuminated by a focused field

Seong-Sue Kim, Yoon-Ki Kim, In-Sik Park, and Sung-Chul Shin  »View Author Affiliations


JOSA A, Vol. 17, Issue 8, pp. 1454-1460 (2000)
http://dx.doi.org/10.1364/JOSAA.17.001454


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Abstract

Reflectance (R), transmittance (T), and absorptance (A) are calculated for a thin-film stack illuminated by a focused field. Based on Debye’s integral representation, the electric and magnetic fields near focus are obtained, and the formulas for R, T, and A are represented as integrals of Poynting vectors. This formulation is applied to the case of a numerical aperture (N.A.) greater than 1.0 as well as to the case of a N.A. less than 1.0, and the corresponding numerical results are presented. They reveal that R, T, and A vary with N.A. and that the amount of variation increases with layer thickness.

© 2000 Optical Society of America

OCIS Codes
(050.1960) Diffraction and gratings : Diffraction theory
(210.4770) Optical data storage : Optical recording
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: August 27, 1999
Revised Manuscript: April 12, 2000
Manuscript Accepted: April 12, 2000
Published: August 1, 2000

Citation
Seong-Sue Kim, Yoon-Ki Kim, In-Sik Park, and Sung-Chul Shin, "Optical properties of a thin-film stack illuminated by a focused field," J. Opt. Soc. Am. A 17, 1454-1460 (2000)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-17-8-1454

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