Reflectance (R), transmittance (T), and absorptance (A) are calculated for a thin-film stack illuminated by a focused field. Based on Debye’s integral representation, the electric and magnetic fields near focus are obtained, and the formulas for R, T, and A are represented as integrals of Poynting vectors. This formulation is applied to the case of a numerical aperture (N.A.) greater than 1.0 as well as to the case of a N.A. less than 1.0, and the corresponding numerical results are presented. They reveal that R, T, and A vary with N.A. and that the amount of variation increases with layer thickness.
© 2000 Optical Society of America
Original Manuscript: August 27, 1999
Revised Manuscript: April 12, 2000
Manuscript Accepted: April 12, 2000
Published: August 1, 2000
Seong-Sue Kim, Yoon-Ki Kim, In-Sik Park, and Sung-Chul Shin, "Optical properties of a thin-film stack illuminated by a focused field," J. Opt. Soc. Am. A 17, 1454-1460 (2000)