General theory of sub-quarterwave multilayers with highly absorbing materials
JOSA A, Vol. 18, Issue 10, pp. 2617-2627 (2001)
http://dx.doi.org/10.1364/JOSAA.18.002617
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Abstract
A general theory of multilayers with enhanced reflectance has been developed based on the superposition of sub-quarterwave layers of various highly radiation-absorbing materials. The theory has been developed by second-order expansion of the multilayer reflectance with respect to the optical-constant differences between the materials in the multilayer. The current paper completes and improves the theory that was developed in a previous paper [J. Opt. Soc. Am. A 18, 1406 (2001)] by including the case of nonnormal incidence and general radiation polarization and by providing more-accurate film thickness values of the optimized multilayer than with the previous theory. The theory provides an accurate approach to the design of a new concept of multilayer coatings with more than two materials. The new multilayers are adequate to enhance the reflectance of the materials particularly in the far and the extreme ultraviolet.
© 2001 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(230.4170) Optical devices : Multilayers
(240.0310) Optics at surfaces : Thin films
(260.7200) Physical optics : Ultraviolet, extreme
(260.7210) Physical optics : Ultraviolet, vacuum
(310.6860) Thin films : Thin films, optical properties
(350.6090) Other areas of optics : Space optics
Citation
Juan I. Larruquert, "General theory of sub-quarterwave multilayers with highly absorbing materials," J. Opt. Soc. Am. A 18, 2617-2627 (2001)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-18-10-2617
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