Electromagnetic analysis of axially symmetric diffractive optical elements illuminated by oblique incident plane waves
JOSA A, Vol. 18, Issue 11, pp. 2901-2907 (2001)
http://dx.doi.org/10.1364/JOSAA.18.002901
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Abstract
We present an analysis of axially symmetric diffractive optical elements illuminated by off-axis or oblique incident plane waves. The analysis is performed with a finite-difference time-domain method that has been formulated to exploit axial symmetry yet accommodate off-axis illumination. This approach is compared with a full three-dimensional formulation and is found to be more efficient in both memory requirements and computational time. Validation and applications of this method are presented.
© 2001 Optical Society of America
[Optical Society of America ]
OCIS Codes
(000.4430) General : Numerical approximation and analysis
(050.1970) Diffraction and gratings : Diffractive optics
(350.3950) Other areas of optics : Micro-optics
Citation
Shouyuan Shi and Dennis W. Prather, "Electromagnetic analysis of axially symmetric diffractive optical elements illuminated by oblique incident plane waves," J. Opt. Soc. Am. A 18, 2901-2907 (2001)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-18-11-2901
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