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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 18, Iss. 11 — Nov. 1, 2001
  • pp: 2901–2907

Electromagnetic analysis of axially symmetric diffractive optical elements illuminated by oblique incident plane waves

Shouyuan Shi and Dennis W. Prather  »View Author Affiliations


JOSA A, Vol. 18, Issue 11, pp. 2901-2907 (2001)
http://dx.doi.org/10.1364/JOSAA.18.002901


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Abstract

We present an analysis of axially symmetric diffractive optical elements illuminated by off-axis or oblique incident plane waves. The analysis is performed with a finite-difference time-domain method that has been formulated to exploit axial symmetry yet accommodate off-axis illumination. This approach is compared with a full three-dimensional formulation and is found to be more efficient in both memory requirements and computational time. Validation and applications of this method are presented.

© 2001 Optical Society of America

OCIS Codes
(000.4430) General : Numerical approximation and analysis
(050.1970) Diffraction and gratings : Diffractive optics
(350.3950) Other areas of optics : Micro-optics

History
Original Manuscript: January 11, 2001
Revised Manuscript: April 20, 2001
Manuscript Accepted: April 20, 2001
Published: November 1, 2001

Citation
Shouyuan Shi and Dennis W. Prather, "Electromagnetic analysis of axially symmetric diffractive optical elements illuminated by oblique incident plane waves," J. Opt. Soc. Am. A 18, 2901-2907 (2001)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-18-11-2901


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