Abstract

The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of >15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orders of magnitude. This enhancement arises both from the antenna effect of the elongated probe and from a proximity effect when the probe is near the substrate surface and its image dipoles play a role.

© 2001 Optical Society of America

Fluorescence imaging of submicrometric lattices of colour centres in LiF by an apertureless scanning near-field optical microscope

P.M. Adam, S. Benrezzak, J.L. Bijeon, P. Royer, S. Guy, B. Jacquier, P. Moretti, R.M. Montereali, M. Piccinini, F. Menchini, F. Somma, C. Seassal, and H. Rigneault
Opt. Express 9(7) 353-359 (2001)

Grating enhanced apertureless near-field optical microscopy

Josip Mihaljevic, Christian Hafner, and Alfred J. Meixner
Opt. Express 23(14) 18401-18414 (2015)

Polarization effects in apertureless scanning near-field optical microscopy:?an experimental study

L. Aigouy, A. Lahrech, S. Grésillon, H. Cory, A. C. Boccara, and J. C. Rivoal
Opt. Lett. 24(4) 187-189 (1999)

Heterodyne apertureless near-field scanning optical microscopy on periodic gold nanowells

Jeffrey E. Hall, Gary P. Wiederrecht, Stephen K. Gray, Shih-Hui Chang, Seokwoo Jeon, John A. Rogers, Renaud Bachelot, and Pascal Royer
Opt. Express 15(7) 4098-4105 (2007)

Effect of the gold crystallinity on the enhanced luminescence signal of scanning probe tips in apertureless near-field optical microscopy

Gitanjali Kolhatkar, Julien Plathier, Alain Pignolet, and Andreas Ruediger
Opt. Express 25(21) 25929-25937 (2017)