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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 18, Iss. 4 — Apr. 1, 2001
  • pp: 839–853

Optical trapping of dielectric particles in arbitrary fields

Alexander Rohrbach and Ernst H. K. Stelzer  »View Author Affiliations

JOSA A, Vol. 18, Issue 4, pp. 839-853 (2001)

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We present a new method to calculate trapping forces of dielectric particles with diameters Dλ in arbitrary electromagnetic, time-invariant fields. The two components of the optical force, the gradient force and the scattering force, are determined separately. Both the arbitrary incident field and the scatterer are represented by plane-wave spectra. The scattering force is determined by means of the momentum transfer in either single- or double-scattering processes. Therefore the second-order Born series is evaluated and solved in the frequency domain by Ewald constructions. Numerical results of our two-force-component approach and an established calculation method are compared and show satisfying agreement. Our procedure is applied to investigate axial trapping by focused waves experiencing effects of aperture illumination and refractive-index mismatch.

© 2001 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(260.0260) Physical optics : Physical optics
(290.0290) Scattering : Scattering

Original Manuscript: May 8, 2000
Revised Manuscript: October 17, 2000
Manuscript Accepted: November 6, 2000
Published: April 1, 2001

Alexander Rohrbach and Ernst H. K. Stelzer, "Optical trapping of dielectric particles in arbitrary fields," J. Opt. Soc. Am. A 18, 839-853 (2001)

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