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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 19, Iss. 1 — Jan. 1, 2002
  • pp: 43–48

Off-diagonal Mueller matrix elements in backscattering from highly diffusive media

Jeremy Ellis, Paul Caillard, and Aristide Dogariu  »View Author Affiliations

JOSA A, Vol. 19, Issue 1, pp. 43-48 (2002)

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Measurements of a reduced Mueller matrix in backscattering from highly diffusive, dielectric samples are reported as a function of the angle of incidence. It was found that the off-diagonal terms depend greatly on the angle of incidence, increasing to a maximum near grazing incidence. We show that, despite a significant scattering originating in the bulk of such diffusive media, the nontrivial behavior of the off-diagonal Muller matrix is primarily due to surface scattering phenomena. The experimental data can be simply explained by assuming a random orientation of small particles and considering only double scattering in the plane of the surface.

© 2002 Optical Society of America

OCIS Codes
(260.5430) Physical optics : Polarization
(290.1350) Scattering : Backscattering
(290.4210) Scattering : Multiple scattering
(290.5820) Scattering : Scattering measurements

Original Manuscript: October 10, 2000
Revised Manuscript: March 8, 2001
Manuscript Accepted: March 8, 2001
Published: January 1, 2002

Jeremy Ellis, Paul Caillard, and Aristide Dogariu, "Off-diagonal Mueller matrix elements in backscattering from highly diffusive media," J. Opt. Soc. Am. A 19, 43-48 (2002)

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