Differential interference contrast x-ray microscopy with twin zone plates
JOSA A, Vol. 19, Issue 4, pp. 797-806 (2002)
http://dx.doi.org/10.1364/JOSAA.19.000797
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Abstract
X-ray imaging in differential interference contrast (DIC) with submicrometer optical resolution was performed by using a twin zone plate (TZP) setup generating focal spots closely spaced within the TZP spatial resolution of 160 nm. Optical path differences introduced by the sample are recorded by a CCD camera in a standard full-field imaging and by an aperture photodiode in a standard scanning transmission x-ray microscope. Applying this x-ray DIC technique, we demonstrate for both the full-field imaging and scanning x-ray microscope methods a drastic increase in image contrast (approximately 20×) for a low-absorbing specimen, similar to the Nomarski DIC method for visible-light microscopy.
© 2002 Optical Society of America
[Optical Society of America ]
OCIS Codes
(180.3170) Microscopy : Interference microscopy
(180.5810) Microscopy : Scanning microscopy
(180.7460) Microscopy : X-ray microscopy
(340.6720) X-ray optics : Synchrotron radiation
(340.7450) X-ray optics : X-ray interferometry
Citation
Burkhard Kaulich, Thomas Wilhein, Enzo Di Fabrizio, Filippo Romanato, Matteo Altissimo, Stefano Cabrini, Barbara Fayard, and Jean Susini, "Differential interference contrast x-ray microscopy with twin zone plates," J. Opt. Soc. Am. A 19, 797-806 (2002)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-19-4-797
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