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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 19, Iss. 5 — May. 1, 2002
  • pp: 902–911

Light scattering from self-affine fractal silver surfaces with nanoscale cutoff: far-field and near-field calculations

José A. Sánchez-Gil, José V. García-Ramos, and Eugenio R. Méndez  »View Author Affiliations

JOSA A, Vol. 19, Issue 5, pp. 902-911 (2002)

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We study the light scattered from randomly rough, one-dimensional, self-affine fractal silver surfaces with nanoscale lower cutoff illuminated by <i>s</i>- or <i>p</i>-polarized Gaussian beams a few micrometers wide. By means of rigorous numerical calculations based on the Green’s theorem integral equation formulation (GTIEF), we obtain both the far- and near-field scattered intensities. The influence of diminishing the size of the fractal lower-scale irregularities (from ~50 nm to a few nanometers) is analyzed in the case of both single realization and ensemble-average magnitudes. For <i>s</i> polarization, variations are small in the far field, being significant only in the higher-spatial-frequency components of evanescent character in the near field. In the case of <i>p</i> polarization, however, the nanoscale cutoff has remarkable effects stemming from the roughness-induced excitation of surface-plasmon polaritons. In the far field, the effect is noticed both in the speckle pattern variation and in the decrease of the total reflected energy upon ensemble averaging, as a result of increased absorption. In the near field, more efficient excitation of localized optical modes is achieved with smaller cutoff, which in turn leads to huge surface electric field enhancements.

© 2002 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(240.6680) Optics at surfaces : Surface plasmons
(290.4210) Scattering : Multiple scattering
(290.5880) Scattering : Scattering, rough surfaces

José A. Sánchez-Gil, José V. García-Ramos, and Eugenio R. Méndez, "Light scattering from self-affine fractal silver surfaces with nanoscale cutoff: far-field and near-field calculations," J. Opt. Soc. Am. A 19, 902-911 (2002)

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