The achievable depth resolution in reconstructing the permittivity profile of a dielectric strip under the Born approximation when data are collected in the Fresnel zone is studied. We consider a rectilinear measurement aperture and an orthogonal and centered rectilinear investigation domain. The roles of the aperture extent and frequency diversity are highlighted.
© 2002 Optical Society of America
Original Manuscript: July 9, 2001
Revised Manuscript: November 14, 2001
Manuscript Accepted: November 14, 2001
Published: June 1, 2002
Rocco Pierri, Angelo Liseno, Raffaele Solimene, and Francesco Tartaglione, "In-depth resolution from multifrequency Born fields scattered by a dielectric strip in the Fresnel zone," J. Opt. Soc. Am. A 19, 1234-1238 (2002)