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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 2, Iss. 10 — Oct. 1, 1985
  • pp: 1693–1697

Measurement of the principal refractive indices of thin films deposited at oblique incidence

I. J. Hodgkinson, F. Horowitz, H. A. Macleod, M. Sikkens, and J. J. Wharton  »View Author Affiliations


JOSA A, Vol. 2, Issue 10, pp. 1693-1697 (1985)
http://dx.doi.org/10.1364/JOSAA.2.001693


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Abstract

Shadowing causes form birefringence in optical thin films that are deposited at oblique incidence. For light incident in the plane containing the direction of deposition and the substrate normal, the TE and TM polarizations in the film are decoupled, and field transfer can be described using 2×2 matrices. The three principal indices of birefringent films are deduced from measurements made on narrow-band interference filters. In one example refractive indices of 2.688, 2.429, and 2.452 were computed for TiO2 deposited at 27° to the substrate normal. Both TiO2 and ZrO2 behave as positive biaxial media.

© 1985 Optical Society of America

History
Original Manuscript: February 4, 1985
Manuscript Accepted: April 30, 1985
Published: October 1, 1985

Citation
I. J. Hodgkinson, F. Horowitz, H. A. Macleod, M. Sikkens, and J. J. Wharton, "Measurement of the principal refractive indices of thin films deposited at oblique incidence," J. Opt. Soc. Am. A 2, 1693-1697 (1985)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-2-10-1693

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