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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 2, Iss. 12 — Dec. 1, 1985
  • pp: 2240–2243

Near-field effects and scattered intensities of electromagnetic waves from random rough surfaces

N. Garcia and E. Stoll  »View Author Affiliations


JOSA A, Vol. 2, Issue 12, pp. 2240-2243 (1985)
http://dx.doi.org/10.1364/JOSAA.2.002240


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Abstract

We present Monte Carlo numerical calculations for the near-field and scattered diffuse intensities of p-polarized light incident upon a random Gaussian correlated surface. We observe that the near field is dominated by two evanescent waves of momentum parallel to the surface Qs and ∼−Qs that in turn produce oscillations in the near field. This is in agreement with a theoretical diagrammatic expansion in the spatial disorder that included the so-called fan diagrams. Our calculations, within a resolution larger than 4° in the scatter angle, do not show a sharp peak or even an extra contribution in the backward diffuse scattered intensity predicted by that theoretical expansion, however. At present, we cannot make any firm conclusions about this because we have to increase resolution and decrease statistical error to elucidate this point.

© 1985 Optical Society of America

History
Original Manuscript: June 6, 1985
Manuscript Accepted: August 28, 1985
Published: December 1, 1985

Citation
N. Garcia and E. Stoll, "Near-field effects and scattered intensities of electromagnetic waves from random rough surfaces," J. Opt. Soc. Am. A 2, 2240-2243 (1985)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-2-12-2240


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References

  1. N. Garcia, E. Stoll, “Monte-Carlo calculation for electromagnetic-wave scattering from random rough surfaces,” Phys. Rev. Lett. 52, 1798 (1984).We note that the angle of incidence θi, when not explicitly indicated, is 24°. [CrossRef]
  2. N. Garcia, “Exact calculations of p-polarized electromagnetic fields incident on grating surfaces: surface polariton resonances,” Opt. Commun. 45, 307 (1983). [CrossRef]
  3. J. S. Langer, T. E. Neal, “Breakdown of the concentration expansion for the impurity resistivity in metals,” Phys. Rev. Lett. 16, 984 (1966). [CrossRef]
  4. L. P. Gorkov, A. I. Larkin, D. E. Khemelnitskii, “Particle conductivity in a two-dimensional random potential,” Pis’ma Zh. Eksp. Teor. Fiz. 30, 248 (1979) [JEPT Lett. 30, 228 (1979)].
  5. D. Vollhardt, P. Wolfle, “Diagrammatic self-consistent treatment of the Anderson localization problem in d< 2 dimensions,” Phys. Rev. B 22, 4666 (1980). [CrossRef]
  6. A. R. McGurn, A. A. Maradudin, V. Celli, “Localization effects in scattering of light from a randomly rough grating,” Phys. Rev. B 31, 4866 (1985). [CrossRef]
  7. C. Lopez, F. J. Yndurain, N. Garcia, “Iterative series for calculating the scattering of waves from a hard corrugated surface,” Phys. Rev. B 18, 970 (1978). [CrossRef]
  8. S. Kirkpatrick, E. Stoll, “A very fast shift register sequence random number generator,” J. Comput. Phys. 40, 517 (1981). [CrossRef]
  9. N. Garcia, N. Cabrera, “New method for solving the scattering of waves from a periodic hard surface: solutions and numerical comparisons with the various formalisms,” Phys. Rev. B 18, 576 (1978). [CrossRef]
  10. This assumption of MMC [Eq. (22)] was pointed out by A. Baratoff, IBM Zurich Research Laboratory, 8803 Rüischlikon, Switzerland (personal communication).
  11. P. W. Anderson, “Localization redux,” Physica 117-B, 30 (1983).

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