The problem of the in-plane scattering of a TE guided wave by both waveguidesurface roughness and refractive-index fluctuations has been analyzed. Simple formulas emerge for the relative strength of the two scattering mechanisms and for the power collected by an off-axis detector. The theory is illustrated by applying it to the case of a step-index slab waveguide.
© 1985 Optical Society of America
Original Manuscript: August 27, 1984
Manuscript Accepted: January 3, 1985
Published: May 1, 1985
D. G. Hall, "In-plane scattering in planar optical waveguides: refractive-index fluctuations and surface roughness," J. Opt. Soc. Am. A 2, 747-752 (1985)