Abstract
The problem of the in-plane scattering of a TE guided wave by both waveguidesurface roughness and refractive-index fluctuations has been analyzed. Simple formulas emerge for the relative strength of the two scattering mechanisms and for the power collected by an off-axis detector. The theory is illustrated by applying it to the case of a step-index slab waveguide.
© 1985 Optical Society of America
Full Article | PDF ArticleMore Like This
M. Arnz and H.-E. Ponath
J. Opt. Soc. Am. A 3(12) 2055-2068 (1986)
R. A. Modavis and D. G. Hall
Opt. Lett. 9(3) 96-98 (1984)
V. Celli, A. A. Maradudin, A. M. Marvin, and A. R. McGurn
J. Opt. Soc. Am. A 2(12) 2225-2239 (1985)