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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 20, Iss. 12 — Dec. 1, 2003
  • pp: 2330–2337

Fourth- and higher-order small-perturbation solution for scattering from dielectric rough surfaces

Metin A. Demir and Joel T. Johnson  »View Author Affiliations


JOSA A, Vol. 20, Issue 12, pp. 2330-2337 (2003)
http://dx.doi.org/10.1364/JOSAA.20.002330


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Abstract

A recursive solution of the small-perturbation method for rough surface scattering is presented. These results permit fourth- and higher-order corrections to rough surface scattering coefficients to be determined in a form that explicitly separates surface and electromagnetic properties. Sample results are presented for the fourth-order correction to the specular reflection coefficient of a rough surface and the sixth-order correction to incoherent scattering cross sections.

© 2003 Optical Society of America

OCIS Codes
(030.5770) Coherence and statistical optics : Roughness
(050.0050) Diffraction and gratings : Diffraction and gratings
(230.1950) Optical devices : Diffraction gratings
(240.5770) Optics at surfaces : Roughness
(280.0280) Remote sensing and sensors : Remote sensing and sensors
(290.5880) Scattering : Scattering, rough surfaces

History
Original Manuscript: January 30, 2003
Revised Manuscript: June 23, 2003
Manuscript Accepted: August 20, 2003
Published: December 1, 2003

Citation
Metin A. Demir and Joel T. Johnson, "Fourth- and higher-order small-perturbation solution for scattering from dielectric rough surfaces," J. Opt. Soc. Am. A 20, 2330-2337 (2003)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-20-12-2330

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