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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 20, Iss. 3 — Mar. 1, 2003
  • pp: 542–547

Theory of total-internal-reflection tomography

P. Scott Carney and John C. Schotland  »View Author Affiliations


JOSA A, Vol. 20, Issue 3, pp. 542-547 (2003)
http://dx.doi.org/10.1364/JOSAA.20.000542


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Abstract

A method is presented to reconstruct three-dimensional tomographic images of weakly scattering objects with subwavelength resolution. The method may be applied to data available in phase-sensitive, total-internal-reflection microscopy. The results follow from an analysis of the near-field inverse scattering problem with evanescent waves.

© 2003 Optical Society of America

OCIS Codes
(100.6950) Image processing : Tomographic image processing
(180.6900) Microscopy : Three-dimensional microscopy
(290.3200) Scattering : Inverse scattering

Citation
P. Scott Carney and John C. Schotland, "Theory of total-internal-reflection tomography," J. Opt. Soc. Am. A 20, 542-547 (2003)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-20-3-542


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References

  1. C. W. McCutchen, “Optical systems for observing surface topography by frustrated total internal reflection and interference,” Rev. Sci. Instrum. 35, 1340–1345 (1964).
  2. P. A. Temple, “Total internal reflection microscopy: a surface inspection technique,” Appl. Opt. 20, 2656–2664 (1981).
  3. P. J. Sides and J. Lo, “Measurement of linear nanometric distances between smooth plane parallel bodies by total internal reflection,” Appl. Phys. Lett. 69, 141–142 (1996).
  4. P. T. C. So, H.-S. Kwon, and C. Dong, “Resolution enhancement in standing-wave total internal reflection microscopy: a point-spread-function engineering approach,” J. Opt. Soc. Am. A 18, 2833–2845 (2001).
  5. P. S. Carney and J. C. Schotland, “Three-dimensional total internal reflection microscopy,” Opt. Lett. 26, 1072–1074 (2001).
  6. D. G. Fischer, “Subwavelength depth resolution in near-field microscopy,” Opt. Lett. 25, 1529–1531 (2000).
  7. D. G. Fischer, “The information content of weakly scattered fields: implications for near-field imaging of three-dimensional structures,” J. Mod. Opt. 47, 1359–1374 (2000).
  8. A. Lewis, M. Isaacson, A. Harootunian, and A. Muray, “Development of a 500 Å spatial resolution light microscope. I. Light is efficiently transmitted through λ/16 diameter apertures,” Ultramicroscopy 13, 227–231 (1984).
  9. D. W. Pohl, W. Denk, and M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
  10. E. Betzig and J. K. Trautman, “Near-field optics: microscopy, spectroscopy, and surface modification beyond the diffraction limit,” Science 257, 189–195 (1992).
  11. R. Dickson, D. Norris, Y.-L. Tzeng, and W. Moerner, “Three-dimensional imaging of single molecules solvated in pores of poly(acrylamide) gels,” Science 274, 966–969 (1996).
  12. J.-J. Greffet, A. Sentenac, and R. Carminati, “Surface profile reconstruction using near-field data,” Opt. Commun. 116, 20–24 (1995).
  13. P. C. Clemmow, The Plane Wave Spectrum Representation of Electromagnetic Fields (Pergamon, Oxford, UK, 1996).
  14. A. A. Maradudin and D. L. Mills, “Scattering and absorption of electromagnetic radiation by a semi-infinite medium in the presence of surface roughness,” Phys. Rev. B 11, 1392–1415 (1975).
  15. F. Natterer, The Mathematics of Computerized Tomography (Wiley, New York, 1986).

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