In an optical diffraction microscopy experiment, one measures the phase and amplitude of the field diffracted by the sample and uses an inversion algorithm to reconstruct its map of permittivity. We show that with an iterative procedure accounting for multiple scattering, it is possible to visualize details smaller than λ/4 with relatively few illumination and observation angles. The roles of incident evanescent waves and noise are also investigated.
© 2003 Optical Society of America
Original Manuscript: October 10, 2002
Revised Manuscript: February 25, 2003
Manuscript Accepted: February 25, 2003
Published: July 1, 2003
Kamal Belkebir and Anne Sentenac, "High-resolution optical diffraction microscopy," J. Opt. Soc. Am. A 20, 1223-1229 (2003)