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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 20, Iss. 8 — Aug. 1, 2003
  • pp: 1582–1588

Resonant scattering of light from a glass/Ag/MgF 2 /air system with rough interfaces and supporting guided modes in attenuated total reflection

Aldo S. Ramı́rez-Duverger, Jorge A. Gaspar-Armenta, and Raúl Garcı́a-Llamas  »View Author Affiliations

JOSA A, Vol. 20, Issue 8, pp. 1582-1588 (2003)

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We report experimental results of the resonant scattering of light from a prism-glass/Ag/MgF2/air system with use of the attenuated total reflection technique for p and s polarized light. Two MgF2 film thicknesses were used. The system with the thinner dielectric layer supports two transverse magnetic (TM) and two transverse electric (TE) guided modes at a wavelength of 632.8 nm, and the system with the thicker dielectric layer supports three TM and three TE guided modes. In both cases we found dips in the specular reflection as a function of incident angle that is due to excitation of guided modes in the MgF2 film. The scattered light shows peaks at angles corresponding to the measured excitation of the guided modes. These peaks are due to single-order scattering and occur for any angle of the incident light. All features in the scattering response are enhanced in resonance conditions, and the efficiency of injecting light into the guide is reduced.

© 2003 Optical Society of America

OCIS Codes
(030.5770) Coherence and statistical optics : Roughness
(230.7390) Optical devices : Waveguides, planar
(290.5880) Scattering : Scattering, rough surfaces
(310.2790) Thin films : Guided waves
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: October 7, 2002
Revised Manuscript: March 31, 2003
Manuscript Accepted: March 31, 2003
Published: August 1, 2003

Aldo S. Ramı́rez-Duverger, Jorge A. Gaspar-Armenta, and Raúl Garcı́a-Llamas, "Resonant scattering of light from a glass/Ag/MgF 2 /air system with rough interfaces and supporting guided modes in attenuated total reflection," J. Opt. Soc. Am. A 20, 1582-1588 (2003)

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  1. C. Amra, “Light scattering from multilayer optics. I. Tools of investigation,” J. Opt. Soc. Am. A 11, 197–210 (1994). [CrossRef]
  2. R. Garcı́a-Llamas, L. E. Regalado, “Effects on rough interfaces in a multilayer stack,” in Optical Interference Coatings, F. Abelès ed., Proc. SPIE2253, 1298–1312 (1994). [CrossRef]
  3. J. M. Elson, “Multilayer-coated optics: guide-wave coupling and scattering by means of interface random roughness,” J. Opt. Soc. Am. A 12, 729–742 (1995). [CrossRef]
  4. R. Garcı́a-Llamas, L. E. Regalado, C. Amra, “Scattering of light from a two-layer system with a rough surface,” J. Opt. Soc. Am. A 16, 2713–2719 (1999). [CrossRef]
  5. R. Garcı́a-Llamas, A. S. Ramı́rez-Duverger, J. A. Gaspar-Armenta, “Resonant scattering of light from a bilayer system with a rough surface between dissimilar me-dia. Transmission,” in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, Washington, D.C., 2001), pp. tuf6-1–tuf6-3.
  6. C. Amra, S. Maure, “Mutual coherence and conical pattern of source optimally excited within multilayer optics,” J. Opt. Soc. Am. A 14, 3114–3124 (1997). [CrossRef]
  7. J. Q. Lu, A. A. Maradudin, T. Michel, “Enhanced backscattering from a rough dielectric film on a reflecting substrate,” J. Opt. Soc. Am. B 8, 311–318 (1991). [CrossRef]
  8. J. A. Sánchez-Gil, A. A. Maradudin, J. Q. Lu, V. D. Freilikher, M. Pustilnick, I. Yurkevich, “Scattering of electromagnetic waves from a bounded medium with a random surface,” Phys. Rev. B 50, 15353–15360 (1994). [CrossRef]
  9. Z. L. Wang, H. Ogura, N. Takahashi, “Enhanced scattering from a planar waveguide structure with a slightly rough boundary,” Phys. Rev. B 52, 6027–6041 (1995). [CrossRef]
  10. J. A. Sánchez-Gil, A. A. Maradudin, J. Q. Lu, V. D. Freilikher, M. Pustilnik, I. Yurkevich, “Satellite peaks in the scattering of p polarized light from a randomly rough film on a perfectly conducting substrate,” J. Mod. Opt. 43, 435–452 (1996). [CrossRef]
  11. A. Madrazo, A. A. Maradudin, “Numerical solutions of the reduced Rayleigh equation for the scattering of electromagnetic waves from rough dielectric films on a perfectly conducting substrates,” Opt. Commun. 134, 251–263 (1997). [CrossRef]
  12. R. Garcı́a-Llamas, C. Márquez-Beltran, “Scattering of s-polarized electromagnetic plane waves from a film with a shallow random rough surface on a perfect conductor,” Appl. Opt. 39, 4698–4705 (2000). [CrossRef]
  13. H. Raether, Surface Plasmon on Smooth and Rough Surfaces and on Gratings (Springer-Verlag, Berlin, 1988).
  14. N. Mayani, F. Varnier, G. Rasigni, “Experimental study of the relationships between the near-normal reflectance, the optical constants, and the roughness of thin silver films,” J. Opt. Soc. Am. A 7, 191–195 (1990). [CrossRef]
  15. Edward D. Palik, Handbook of Optical Constants of Solids (Academic, New York, 1991).

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