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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 21, Iss. 10 — Oct. 1, 2004
  • pp: 2019–2022

Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO2 interface

R. M. A. Azzam and Cristina L. Spinu  »View Author Affiliations

JOSA A, Vol. 21, Issue 10, pp. 2019-2022 (2004)

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An achromatic infrared (λ = 1.2–4 μm), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried Si–SiO<sub>2</sub> interface at an angle of incidence φ near 33°, where ∂Δ/∂φ = 0. The retardance Δ deviates from 90° by <±2° within a field of view of ±10° (in air) over the entire bandwidth. Because the SiO<sub>2</sub> layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.

© 2004 Optical Society of America

OCIS Codes
(230.0230) Optical devices : Optical devices
(230.5440) Optical devices : Polarization-selective devices
(240.0240) Optics at surfaces : Optics at surfaces
(260.2130) Physical optics : Ellipsometry and polarimetry
(260.5430) Physical optics : Polarization

R. M. A. Azzam and Cristina L. Spinu, "Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO2 interface," J. Opt. Soc. Am. A 21, 2019-2022 (2004)

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  1. W. A. Shurcliff, Polarized Light (Harvard University Press, Cambridge, Mass., 1962).
  2. D. Clarke and J. F. Grainger, Polarized Light and Optical Measurement (Pergamon, New York, 1971).
  3. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1987).
  4. B. Boulbry, B. Bousquet, B. Le Jeune, Y. Guern, and J. Lotrian, “Polarization errors associated with zero-order achromatic quarter-wave plates in the whole visible spectral range,” Opt. Express 9, 225–235 (2001).
  5. D. R. Solli, C. F. McCormick, R. Y. Chia, and J. M. Hickmann, “Birefringence in two-dimensional bulk photonic crystals applied to the construction of quarter-wave plates,” Opt. Express 11, 125–133 (2003).
  6. R. M. A. Azzam and F. A. Mahmoud, “Tilted bilayer membranes as simple transmission quarter-wave retardation plates,” J. Opt. Soc. Am. A 18, 421–425 (2001).
  7. R. M. A. Azzam and F. A. Mahmoud, “Symmetrically coated pellicle beam splitters for dual quarter-wave retardation in reflection and transmission,” Appl. Opt. 41, 235–238 (2002).
  8. R. M. A. Azzam and A. De, “Circular polarization beam splitter that uses frustrated total internal reflection by embedded, symmetric, achiral multilayer coating,” Opt. Lett. 28, 355–357 (2003).
  9. R. C. Enger and S. K. Case, “Optical elements with ultrahigh spatial-frequency surface corrugation,” Appl. Opt. 22, 3220–3228 (1983).
  10. A. G. Lopez and H. G. Craighead, “Wave-plate polarizing beam splitter based on a form-birefringent multilayer grating,” Opt. Lett. 23, 1627–1629 (1998).
  11. W. H. Southwell, “Multilayer coating design achieving a broadband 90° phase shift,” Appl. Opt. 19, 2688–2692 (1980).
  12. J. H. Apfel, “Phase retardance of periodic multilayer mirrors,” Appl. Opt. 21, 733–738 (1982).
  13. E. Spiller, “Totally reflecting thin-film phase retarders,” Appl. Opt. 23, 3544–3549 (1984).
  14. M. M. K. Howlader and R. M. A. Azzam, “Periodic and quasiperiodic nonquarterwave multilayer coatings for 90-deg reflection phase retardance at 45-deg angle of incidence,” Opt. Eng. 34, 869–875 (1995).
  15. J. M. Bennett, “Critical evaluation of rhomb-type quarterwave retarders,” Appl. Opt. 9, 2123–2129 (1970).
  16. I. Filinski and T. Skettrup, “Achromatic phase retarders constructed from right-angle prisms: design,” Appl. Opt. 23, 2747–2751 (1984).
  17. Technical Sessions “Optical Silicon I & II,” Conference program, 2002 OSA Annual Meeting, September 29-October 3, 2002, Orlando, Fla.
  18. R. M. A. Azzam and M. M. K. Howlader, “Silicon-based polarization optics for the 1.30- and 1.55-μm communication wavelengths,” J. Lightwave Technol. 14, 873–878 (1996).
  19. M. Born and E. Wolf, Principles of Optics (Pergamon, New York, 1975).
  20. R. M. A. Azzam, “Phase shifts that accompany total internal reflection at a dielectric–dielectric interface,” J. Opt. Soc. Am. A 21, 1559–1563 (2004).
  21. W. J. Tropf, M. E. Thomas, and T. J. Harris, “Properties of crystals and glasses,” in Handbook of Optics, Vol. II, M. Bass, E. W. Van Stryland, D. R. Williams, and W. L. Wolfe, eds. (McGraw-Hill, New York, 1995), Chap. 33.
  22. S. Zhu, A. W. Yu, D. Hawley, and R. Roy, “Frustrated total internal reflection: a demonstration and review,” Am. J. Phys. 54, 601–607 (1986).
  23. R. M. A. Azzam and K. Javily, “Antireflecting and polarizing transparent bilayer coatings on absorbing substrates at oblique incidence,” Appl. Opt. 24, 519–526 (1985).
  24. A. Röseler, Infrared Spectroscopic Ellipsometry (Akademie-Verlag, Berlin, 1990).

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