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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Vol. 21, Iss. 10 — Oct. 1, 2004
  • pp: 2019–2022

Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO2 interface

R. M. A. Azzam and Cristina L. Spinu  »View Author Affiliations

JOSA A, Vol. 21, Issue 10, pp. 2019-2022 (2004)

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An achromatic infrared (λ=1.24 μm), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried SiSiO2 interface at an angle of incidence ϕ near 33°, where Δ/ϕ=0. The retardance Δ deviates from 90° by <±2° within a field of view of ±10° (in air) over the entire bandwidth. Because the SiO2 layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.

© 2004 Optical Society of America

OCIS Codes
(230.0230) Optical devices : Optical devices
(230.5440) Optical devices : Polarization-selective devices
(240.0240) Optics at surfaces : Optics at surfaces
(260.2130) Physical optics : Ellipsometry and polarimetry
(260.5430) Physical optics : Polarization

Original Manuscript: March 31, 2004
Revised Manuscript: May 19, 2004
Manuscript Accepted: May 19, 2004
Published: October 1, 2004

R. M. A. Azzam and Cristina L. Spinu, "Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO2 interface," J. Opt. Soc. Am. A 21, 2019-2022 (2004)

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