Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO2 interface
JOSA A, Vol. 21, Issue 10, pp. 2019-2022 (2004)
http://dx.doi.org/10.1364/JOSAA.21.002019
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Abstract
An achromatic infrared (λ = 1.2–4 μm), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried Si–SiO2 interface at an angle of incidence φ near 33°, where ∂Δ/∂φ = 0. The retardance Δ deviates from 90° by <±2° within a field of view of ±10° (in air) over the entire bandwidth. Because the SiO2 layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.
© 2004 Optical Society of America
OCIS Codes
(230.0230) Optical devices : Optical devices
(230.5440) Optical devices : Polarization-selective devices
(240.0240) Optics at surfaces : Optics at surfaces
(260.2130) Physical optics : Ellipsometry and polarimetry
(260.5430) Physical optics : Polarization
Citation
R. M. A. Azzam and Cristina L. Spinu, "Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO2 interface," J. Opt. Soc. Am. A 21, 2019-2022 (2004)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-21-10-2019
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