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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Vol. 21, Iss. 2 — Feb. 1, 2004
  • pp: 280–287

Theory for the measurements of dispersion characteristics in waveguiding structures with a scanning near-field optical microscope

Hugo J. W. M. Hoekstra, Dion J. W. Klunder, and Alfred Driessen  »View Author Affiliations


JOSA A, Vol. 21, Issue 2, pp. 280-287 (2004)
http://dx.doi.org/10.1364/JOSAA.21.000280


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Abstract

A theory is presented for the interpretation of scanning near-field optical microscope measurements on pulses propagating in waveguiding structures. It is shown how the dispersion characteristics of the propagating guided modes may be derived from such experiments. Then it is demonstrated how to calibrate the scanning tip position and to derive experimental values for reflection and transmission of modes in identical single-mode waveguides connected to a photonic device such as a micro cavity.

© 2004 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(130.2790) Integrated optics : Guided waves
(130.3120) Integrated optics : Integrated optics devices
(240.0240) Optics at surfaces : Optics at surfaces
(240.7040) Optics at surfaces : Tunneling

History
Original Manuscript: June 24, 2003
Revised Manuscript: October 1, 2003
Manuscript Accepted: October 14, 2003
Published: February 1, 2004

Citation
Hugo J. W. M. Hoekstra, Dion J. W. Klunder, and Alfred Driessen, "Theory for the measurements of dispersion characteristics in waveguiding structures with a scanning near-field optical microscope," J. Opt. Soc. Am. A 21, 280-287 (2004)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-21-2-280

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