Two-dimensional imaging theory of confocal self-interference microscopy
JOSA A, Vol. 22, Issue 12, pp. 2737-2745 (2005)
http://dx.doi.org/10.1364/JOSAA.22.002737
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Abstract
A two-dimensional coherent imaging equation is derived for confocal self-interference microscopy (CSIM), which uses a birefringent material to generate an interference pattern in the detection optics. This interference pattern, called a self-interference pattern, sharpens the point-spread function (PSF) along the lateral direction. To derive the imaging equation, an equation for the self-interference pattern is derived. Numerical simulation results based on the imaging equation are presented. One-point response results show a 42.8% reduction in the FWHM of the lateral PSF. Two-point response results show a nearly twofold improvement in two-point resolution.
© 2005 Optical Society of America
OCIS Codes
(110.1650) Imaging systems : Coherence imaging
(180.1790) Microscopy : Confocal microscopy
(260.1440) Physical optics : Birefringence
(260.3160) Physical optics : Interference
(330.6130) Vision, color, and visual optics : Spatial resolution
ToC Category:
Microscopy
Virtual Issues
Vol. 1, Iss. 1 Virtual Journal for Biomedical Optics
Citation
DongKyun Kang and DaeGab Gweon, "Two-dimensional imaging theory of confocal self-interference microscopy," J. Opt. Soc. Am. A 22, 2737-2745 (2005)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-22-12-2737
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