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Journal of the Optical Society of America A

Journal of the Optical Society of America A


  • Editor: Stephen A. Burns
  • Vol. 22, Iss. 12 — Dec. 1, 2005
  • pp: 2872–2879

Single-exposure, photorefractive holographic surface contouring with multiwavelength diode lasers

Eduardo A. Barbosa, Antonio A.V. Filho, Marcos R.R. Gesualdi, Bruno G. Curcio, Mikiya Muramatsu, and Diogo Soga  »View Author Affiliations

JOSA A, Vol. 22, Issue 12, pp. 2872-2879 (2005)

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We studied the use of multiwavelength diode lasers for surface profilometry through holographic recording in sillenite Bi 12 Ti O 20 crystals. When such lasers are used, the holographic image from single-exposure recordings appears covered with interference fringes providing information on the surface relief of the object. By taking advantage of the narrow interference fringes due to the multiwavelength emission of the laser, we obtained interferograms by holographic recording with two reference beams, which improves the surface analysis by visual inspection and enhances the profilometry sensitivity.

© 2005 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.2880) Instrumentation, measurement, and metrology : Holographic interferometry
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

ToC Category:

Original Manuscript: February 23, 2005
Revised Manuscript: April 25, 2005
Manuscript Accepted: May 31, 2005
Published: December 1, 2005

Marcos R.R. Gesualdi, Bruno G. Curcio, Mikiya Muramatsu, Eduardo A. Barbosa, Antonio A.V. Filho, and Diogo Soga, "Single-exposure, photorefractive holographic surface contouring with multiwavelength diode lasers," J. Opt. Soc. Am. A 22, 2872-2879 (2005)

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