We report the first experimental realization of total internal reflection (TIR) diffraction gratings. Performance of less than 0.7-dB insertion loss (IL) for both TE and TM polarizations and 0.5-dB polarization-dependent loss (PDL) are predicted over a 50-nm spectral bandwidth with simultaneous fabrication tolerances on the depth and the duty cycle of binary gratings of ±5% and ±14%, respectively. Nineteen gratings were fabricated that met these specifications, yielding IL and PDL values less than 0.6 and 0.2 dB, respectively, across the entire 50-nm bandwidth. Measurements made under the Littrow configuration resulted in high efficiency and low PDL across a 100-nm bandwidth, with up to 100% diffraction efficiency within the experimental measurement error.
© 2005 Optical Society of America
(050.0050) Diffraction and gratings : Diffraction and gratings
(050.1950) Diffraction and gratings : Diffraction gratings
(050.2770) Diffraction and gratings : Gratings
(230.1950) Optical devices : Diffraction gratings
(260.6970) Physical optics : Total internal reflection
John R. Marciante, Jeffrey I. Hirsh, Daniel H. Raguin, and Eric T. Prince, "Polarization-insensitive high-dispersion total internal reflection diffraction gratings," J. Opt. Soc. Am. A 22, 299-305 (2005)