Vector near-field calculation of scanning near-field optical microscopy probes using Borgnis potentials as auxiliary functions
JOSA A, Vol. 22, Issue 7, pp. 1263-1273 (2005)
http://dx.doi.org/10.1364/JOSAA.22.001263
Acrobat PDF (435 KB)
Abstract
A new boundary integral equation method for solving the near field in three-dimensional vector form in scanning near-field optical microscopy (SNOM) using Borgnis potentials as auxiliary functions is presented. A boundary integral equation of the electromagnetic fields, expressed by Borgnis potentials, is derived based on Green's theorem. The harmonic expansion in rotationally symmetric SNOM probe-sample systems is studied, and the three-dimensional electromagnetic problem is partly simplified into a two-dimensional one. The boundary conditions of Borgnis potentials both on dielectric boundaries and on perfectly conducting boundaries are derived. Relevant algorithms were studied, and a computer program was written. As an example, a SNOM probe-sample system composed of a round metal-covered probe and a sample with a flat surface has been numerically studied, and the computational results are given. This new method can be used efficiently for other electromagnetic field problems with round subwavelength structures.
© 2005 Optical Society of America
OCIS Codes
(100.6640) Image processing : Superresolution
(110.0180) Imaging systems : Microscopy
(110.1220) Imaging systems : Apertures
(180.5810) Microscopy : Scanning microscopy
Citation
Xueen Wang, Zhaozhong Fan, and Tiantong Tang, "Vector near-field calculation of scanning near-field optical microscopy probes using Borgnis potentials as auxiliary functions," J. Opt. Soc. Am. A 22, 1263-1273 (2005)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-22-7-1263
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