Analytical method for the identification of a thin-strip defect in a planar waveguide
JOSA A, Vol. 23, Issue 10, pp. 2650-2656 (2006)
http://dx.doi.org/10.1364/JOSAA.23.002650
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Abstract
Nondestructive reconstruction of the location and width of a thin-strip defect in a strongly confined planar waveguide is considered. Explicit reconstruction formulas are given for a quick reconstruction of a thin-strip defect whose width is small by measuring the scattered fields at the two end faces of the planar waveguide for two frequencies. Numerical results are given, and the analytical reconstruction method is shown to be reliable regardless of the location of the defect.
© 2006 Optical Society of America
OCIS Codes
(000.3860) General : Mathematical methods in physics
(000.4430) General : Numerical approximation and analysis
(100.3190) Image processing : Inverse problems
(220.4840) Optical design and fabrication : Testing
(230.7390) Optical devices : Waveguides, planar
ToC Category:
Optical Devices
History
Original Manuscript: October 13, 2005
Revised Manuscript: March 9, 2006
Manuscript Accepted: April 27, 2006
Citation
Ran Liao, Vladimir Romanov, and Sailing He, "Analytical method for the identification of a thin-strip defect in a planar waveguide," J. Opt. Soc. Am. A 23, 2650-2656 (2006)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-23-10-2650
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