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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Stephen A. Burns
  • Vol. 23, Iss. 11 — Nov. 1, 2006
  • pp: 2880–2887

Determination of optical constants of scandium films in the 20 1000 eV range

Mónica Fernández-Perea, Juan I. Larruquert, José A. Aznárez, José A. Méndez, Luca Poletto, A. Marco Malvezzi, Angelo Giglia, and Stefano Nannarone  »View Author Affiliations


JOSA A, Vol. 23, Issue 11, pp. 2880-2887 (2006)
http://dx.doi.org/10.1364/JOSAA.23.002880


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Abstract

The transmittance of thin films of Sc deposited by evaporation in ultrahigh vacuum conditions has been investigated in the 20 1000 eV spectral range. Transmittance measurements were performed in situ on Sc layers that were deposited over grids coated with a C support film. Transmittance measurements were used to obtain the extinction coefficient of Sc films at each individual photon energy investigated. These data, along with the data available in the literature for the rest of the spectrum, were used to obtain the refractive index of Sc by means of the Kramers–Krönig analysis. Sum-rule tests indicated an acceptable consistency of the data.

© 2006 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(230.4170) Optical devices : Multilayers
(260.7200) Physical optics : Ultraviolet, extreme
(310.6860) Thin films : Thin films, optical properties
(350.2450) Other areas of optics : Filters, absorption

ToC Category:
Optical Devices

History
Original Manuscript: December 19, 2005
Manuscript Accepted: May 19, 2006

Citation
Mónica Fernández-Perea, Juan I. Larruquert, José A. Aznárez, José A. Méndez, Luca Poletto, A. Marco Malvezzi, Angelo Giglia, and Stefano Nannarone, "Determination of optical constants of scandium films in the 20-1000 eV range," J. Opt. Soc. Am. A 23, 2880-2887 (2006)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-23-11-2880

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