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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Stephen A. Burns
  • Vol. 23, Iss. 12 — Dec. 1, 2006
  • pp: 3139–3149

On the fundamental imaging-depth limit in two-photon microscopy

Patrick Theer and Winfried Denk  »View Author Affiliations


JOSA A, Vol. 23, Issue 12, pp. 3139-3149 (2006)
http://dx.doi.org/10.1364/JOSAA.23.003139


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Abstract

We have analyzed how the maximal imaging depth of two-photon microscopy in scattering samples depends on properties of the sample and the imaging system. We find that the imaging depth increases with increasing numerical aperture and staining inhomogeneity and with decreasing excitation-pulse duration and scattering anisotropy factor, but is ultimately limited by near-surface fluorescence with slight improvements possible using special detection strategies.

© 2006 Optical Society of America

OCIS Codes
(140.4480) Lasers and laser optics : Optical amplifiers
(170.7050) Medical optics and biotechnology : Turbid media
(180.2520) Microscopy : Fluorescence microscopy
(180.5810) Microscopy : Scanning microscopy
(180.6900) Microscopy : Three-dimensional microscopy
(190.4180) Nonlinear optics : Multiphoton processes

ToC Category:
Microscopy

History
Original Manuscript: April 12, 2006
Revised Manuscript: June 20, 2006
Manuscript Accepted: June 26, 2006

Virtual Issues
Vol. 2, Iss. 1 Virtual Journal for Biomedical Optics

Citation
Patrick Theer and Winfried Denk, "On the fundamental imaging-depth limit in two-photon microscopy," J. Opt. Soc. Am. A 23, 3139-3149 (2006)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-23-12-3139

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