Carrier phase component removal: a generalized least-squares approach
JOSA A, Vol. 23, Issue 2, pp. 435-443 (2006)
http://dx.doi.org/10.1364/JOSAA.23.000435
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Abstract
In fringe projection profilometry, an object shape is evaluated through phase distribution extracted from a projected fringe pattern. For parallel illumination geometry, the carrier phase component introduced by the fringes is spatially linear, whereas nonparallel illumination would lead to a nonlinear carrier. In this study, a general approach for the removal of a nonlinear-carrier phase component is proposed. A series expansion technique is used to approximate the carrier phase function, and a least-squares method is developed to estimate the unknown coefficients of the series. The theoretical analysis is given on the basis of a divergent illumination geometry with carrier fringes in the x direction. The method is also extended to include a curved surface-fitting approach, which is applicable to various measurement system geometries.
© 2005 Optical Society of America
OCIS Codes
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: May 2, 2005
Manuscript Accepted: June 3, 2005
Citation
Lujie Chen and Cho Jui Tay, "Carrier phase component removal: a generalized least-squares approach," J. Opt. Soc. Am. A 23, 435-443 (2006)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-23-2-435
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