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Journal of the Optical Society of America A

Journal of the Optical Society of America A

| OPTICS, IMAGE SCIENCE, AND VISION

  • Editor: Stephen A. Burns
  • Vol. 23, Iss. 4 — Apr. 1, 2006
  • pp: 906–911

Electromagnetic field computation in semiconductor laser resonators

Tuomas Vallius, Jani Tervo, Pasi Vahimaa, and Jari Turunen  »View Author Affiliations


JOSA A, Vol. 23, Issue 4, pp. 906-911 (2006)
http://dx.doi.org/10.1364/JOSAA.23.000906


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Abstract

An electromagnetic method based on rigorous diffraction theory of gratings is applied to the analysis of fields in semiconductor laser cavities. The method is based on the Fourier modal method; it is fully rigorous for infinitely periodic resonators and highly accurate for single resonators when absorbing boundary conditions are applied. Fundamental-mode intracavity and near-field distributions are evaluated for some selected geometries, and resonance frequencies are predicted.

© 2006 Optical Society of America

OCIS Codes
(050.1960) Diffraction and gratings : Diffraction theory
(050.1970) Diffraction and gratings : Diffractive optics
(250.3140) Optoelectronics : Integrated optoelectronic circuits

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: August 5, 2005
Manuscript Accepted: September 26, 2005

Citation
Tuomas Vallius, Jani Tervo, Pasi Vahimaa, and Jari Turunen, "Electromagnetic field computation in semiconductor laser resonators," J. Opt. Soc. Am. A 23, 906-911 (2006)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-23-4-906

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