High-resolution ab initio three-dimensional x-ray diffraction microscopy
JOSA A, Vol. 23, Issue 5, pp. 1179-1200 (2006)
http://dx.doi.org/10.1364/JOSAA.23.001179
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Abstract
Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.
© 2006 Optical Society of America
OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(100.5070) Image processing : Phase retrieval
(100.6890) Image processing : Three-dimensional image processing
(110.1650) Imaging systems : Coherence imaging
(110.6880) Imaging systems : Three-dimensional image acquisition
(180.6900) Microscopy : Three-dimensional microscopy
(340.7460) X-ray optics : X-ray microscopy
ToC Category:
X-ray Optics
History
Original Manuscript: August 26, 2005
Revised Manuscript: October 14, 2005
Manuscript Accepted: October 18, 2005
Virtual Issues
Vol. 1, Iss. 6 Virtual Journal for Biomedical Optics
Citation
Henry N. Chapman, Anton Barty, Stefano Marchesini, Aleksandr Noy, Stefan P. Hau-Riege, Congwu Cui, Malcolm R. Howells, Rachel Rosen, Haifeng He, John C. H. Spence, Uwe Weierstall, Tobias Beetz, Chris Jacobsen, and David Shapiro, "High-resolution ab initio three-dimensional x-ray diffraction microscopy," J. Opt. Soc. Am. A 23, 1179-1200 (2006)
http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-23-5-1179
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