We present a technique for efficiently computing the reflection and transmission of light by arbitrary systems of turbid layers. To approximate the steady-state reflectance and transmittance without the need to solve difficult boundary conditions, we convolve the reflectance and transmittance profiles of individual layers. We extend single-slab boundary conditions to handle index-of-refraction mismatches between turbid slabs and account for interlayer scattering by applying methods similar to Kubelka–Munk theory in frequency space. We demonstrate good agreement between the reflectance and the transmittance predicted by our model and numerical Monte Carlo methods and show that the far-source reflectance and transmittance of multilayered turbid materials are dominated by interlayer scattering.
© 2006 Optical Society of America
Medical Optics and Biotechnology
Original Manuscript: August 24, 2005
Manuscript Accepted: October 21, 2005
Vol. 1, Iss. 7 Virtual Journal for Biomedical Optics
Craig Donner and Henrik Wann Jensen, "Rapid simulation of steady-state spatially resolved reflectance and transmittance profiles of multilayered turbid materials," J. Opt. Soc. Am. A 23, 1382-1390 (2006)